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The Optical Absorption Edge in Thin Amorphous Oxide Films Based on Cerium Dioxide
Author(s) -
AlDhhan Z. T.,
Hogarth C. A.,
Riddleston N.
Publication year - 1988
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2221450111
Subject(s) - absorption edge , amorphous solid , materials science , absorption (acoustics) , thin film , evaporation , oxide , enhanced data rates for gsm evolution , cerium , analytical chemistry (journal) , optics , optoelectronics , band gap , nanotechnology , composite material , chemistry , crystallography , metallurgy , telecommunications , computer science , physics , chromatography , thermodynamics
Measurements of optical absorption of thin film samples of CeO 2 /SnO 2 and CeO 2 /GeO 2 prepared by a co‐evaporation process at a pressure in the range 1.06 to 1.33 mPa, and having a thickness of ≈300 nm are reported. It is found that the fundamental optical absorption edge is sharp, much more like that expected for a crystalline material rather than the usual form for amorphous material, and the optical gap is increased by the addition of CeO 2 to SnO 2 and GeO 2 films.