Premium
A New Luminescent Band Induced in NaF by Ion Implantation
Author(s) -
Afonso C. N.,
Gomez I. M.,
Ortiz C.
Publication year - 1987
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2221430238
Subject(s) - luminescence , ion , materials science , ion implantation , doping , annealing (glass) , optoelectronics , crystallographic defect , analytical chemistry (journal) , chemistry , crystallography , organic chemistry , chromatography , composite material
High concentrations of defects are induced in a thin surface layer of pure and doped NaF crystals by ion implantation with 280 keV H + , H + 2 , B + , and Ne + ions. Laser induced luminescence in these crystals shows a new band peaking at 750 nm. It presents a high stability under thermal annealing and optical treatments. The experimental results point out that those centers responsible for this emission band are F 2 disturbed centers which are only created under ion implantation.
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom