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Optical Properties of Al Films within and beyond the Effective‐Medium Approximation
Author(s) -
Jungk G.,
Schultze V.
Publication year - 1987
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2221390228
Subject(s) - crystallite , dielectric , dielectric function , electric field , photon , condensed matter physics , materials science , function (biology) , physics , optics , atomic physics , optoelectronics , quantum mechanics , metallurgy , evolutionary biology , biology
The complex dielectric function of slightly differently prepared polycrystalline Al films is determined ellipsometrically for photon energies h ω between 1 and 4 eV. The results can be explained by symmetrical and asymmetrical EMA for h ω ≧ 1.8 eV through the incorporation of Al 2 O 3 . Below 1.8 eV significant discrepances occur due to resonantly enhanced electric fields in nonspherical Al grains surrounded by a dielectric.