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X K Edge Absorption of Titanium and L Edges of Tantalum in (Ti, Ta)O 2 Rutile Solid Solutions
Author(s) -
Poumellec B.,
Marucco J. F.,
Touzelin E.
Publication year - 1986
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2221370213
Subject(s) - tantalum , valence (chemistry) , titanium , ionic radius , materials science , crystal field theory , absorption edge , rutile , crystal (programming language) , analytical chemistry (journal) , exciton , absorption spectroscopy , crystallography , band gap , ion , chemistry , condensed matter physics , optics , metallurgy , physics , optoelectronics , organic chemistry , chromatography , computer science , programming language
An analysis of the Ti K edge and Ta L edges yields that the chemical shift amounts to 0.8 eV by a valence charge increase. An exciton line is resolved like in other rutiles. Exciton binding energy amounts to 1.1 eV and decreases to 0.6 eV for high tantalum content. The coordination polyhedron size of titanium increases to 11 × 10 −3 nm with the tantalum content. This is essentially due to the increase of ionic radius of titanium by the valence charge increase. The crystal field splitting is found to be 3.1 eV for Ti IV , 2.1 eV for Ti III , and (5.5 to 6.0) eV for Ta V . It seems that the crystal field splitting is well correlated with the valence charge. Additionally a procedure is described to add several × absorption spectra recorded on several samples with the same composition but with different thicknesses.