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Effects of a thin transition layer on the dispersion relation of surface polaritons on a randomly rough surface
Author(s) -
Pechstedt R.,
Leine L.
Publication year - 1986
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2221350235
Subject(s) - dispersion relation , polariton , dispersion (optics) , materials science , surface (topology) , surface roughness , condensed matter physics , layer (electronics) , position (finance) , surface finish , optics , rough surface , physics , mathematics , geometry , composite material , finance , economics
The dispersion relation of an unretarded surface polariton propagating on a rough surface covered with a thin transition layer is derived. The interfaces are assumed to be completely correlated Numerical calculations of the dispersion relation are performed for an Al substrake with an Al 2 O 3 layer. It is found that the magnitude of the frequency shift in comparison with an analogous smooth system depends on the layer thickness and the correlation length of the roughness. The position of the maximum shift depends on the correlation length only.