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Surface semichanneling of molecular ions
Author(s) -
Shulga V. I.
Publication year - 1986
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2221340111
Subject(s) - specular reflection , ion , scattering , reflection (computer programming) , crystal (programming language) , molecule , molecular dynamics , atomic physics , copper , surface (topology) , molecular physics , optics , materials science , chemistry , physics , computational chemistry , geometry , quantum mechanics , computer science , mathematics , programming language , metallurgy
Computer simulation technique is used to study the scattering of 30 keV N 2 ions by the surface semichannels of a copper crystal. The specular reflection intensities of molecular and dissociated ions and the orientations of the reflected molecules are analyzed. The trajectory focusing is found to affect essentially the molecular scattering near the semichannel direction. A simple formula is obtained which relates the semichannel focusing energy directly to the interatomic potential.

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