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Photoelectron Diffraction and Band Structure Effects in ARXPS from the Valence Bands of GeS
Author(s) -
Chassé T.,
Berg U.,
Brümmer O.
Publication year - 1985
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2221320114
Subject(s) - valence (chemistry) , x ray photoelectron spectroscopy , diffraction , valence band , anisotropy , semimetal , spectral line , azimuth , electronic band structure , materials science , polar , condensed matter physics , atomic physics , chemistry , molecular physics , physics , band gap , optics , nuclear magnetic resonance , organic chemistry , astronomy
X‐ray photoelectron spectra of the valence band region of GeS are measured in dependence on polar and azimuthal angle. The anisotropy of the valence band structures is due to both, influences of initial state wave function and photoelectron diffraction. By these means in addition to the symmetry character of initial states the atomic nature of different valence band peaks can also be explained.