51 V NMR of Amorphous and Crystalline V‐Zr Alloys | Zendy

Bakonyi I. | Zendy; Han K.S. | Zendy; Schone H. E. | Zendy

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51 V NMR of Amorphous and Crystalline V‐Zr Alloys

Author(s) -

Bakonyi I.,

Han K.S.,

Schone H. E.

Publication year - 1985

Publication title -

physica status solidi (b)

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.51

H-Index - 109

eISSN - 1521-3951

pISSN - 0370-1972

DOI - 10.1002/pssb.2221310126

Subject(s) - amorphous solid , knight shift , laser linewidth , materials science , amorphous metal , sputtering , copper , thin film , quadrupole , analytical chemistry (journal) , crystallography , condensed matter physics , nuclear magnetic resonance , metallurgy , chemistry , atomic physics , physics , optics , nanotechnology , superconductivity , laser , chromatography

Results of 51 V NMR Knight shift and linewidth measurements are described for thin films of V 100− x Zr x b.c.c. crystalline ( x = 6.4 and 8.4) and amorphous ( x = 17.2, 28, and 46.4) alloys prepared by rf sputtering onto copper substrates. The field dependence of the linewidth and, for x = 28 and 46.4, heat‐treatment effects were also considered. Based on these experimental data, quadrupole effect, electronic structure, and chemical short‐range order of amorphous V‐Zr alloys are discussed.

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