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The Refractive Index and the Exciton Transition Oscillator Strength of CdSe Single Crystals
Author(s) -
Terekhova S. F.,
Onishchenko N. A.,
Talenskii O. N.,
Pendur S. A.
Publication year - 1985
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2221310121
Subject(s) - oscillator strength , exciton , refractive index , independence (probability theory) , materials science , interferometry , condensed matter physics , optics , physics , optoelectronics , quantum mechanics , mathematics , statistics , spectral line
Abstract The dependences of the refractive index and the group velocity of light on the photon energy are obtained near the exciton transitions of CdSe single crystals at 5 K by the method of twobeam interferometry. The independence of the oscillator strength on the sample thickness is determined for the exciton transitions in CdSe. The results are compared with the data obtained by other's methods in recent papers.