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Valence Band Investigations of GaS by Means of Polarized X‐Ray Emission Spectra
Author(s) -
Dräger G.,
Czolbe W.,
Schulz E.,
Simunek A.,
Drahokoupil J.,
Kucherenko Yu. N.,
Nemoshkalenko V. V.
Publication year - 1985
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2221310119
Subject(s) - spectral line , pseudopotential , valence band , atomic physics , emission spectrum , valence (chemistry) , spectrometer , molecular physics , chemistry , materials science , band gap , physics , optics , optoelectronics , organic chemistry , astronomy
The polarized K‐emission valence band spectra of the layer compound GaS are measured for both the components, Ga and S. For Ga spectra Johanm‐type and double crystal spectrometers are used. All spectra are calculated by the self‐consistent pseudopotential band structure method and also by the X α ‐scattered‐wave cluster calculation. The calculated and measured spectra are compared and discussed.