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X‐Ray Photoelectron and Auger Electron Spectra of Cadmium Thin Films
Author(s) -
Jewell B. E.,
Halder N. C.,
Swartz W. E.
Publication year - 1985
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2221300233
Subject(s) - x ray photoelectron spectroscopy , auger , spectral line , auger electron spectroscopy , analytical chemistry (journal) , torr , thin film , chemistry , valence electron , materials science , atomic physics , electron , nuclear magnetic resonance , nanotechnology , physics , astronomy , chromatography , quantum mechanics , nuclear physics , thermodynamics
The X‐ray photoelectron spectra (XPS) and Auger electron spectra (AES) are measured for Cd thin films deposited on microscopic glass slides by thermal evaporation at a pressure of 10 −8 Torr. The deconvolution procedure is utilized with appropriate error control and response function for resolution and enhancement of the spectral lines. The binding energies of the valence and core orbitals are determined and the MNN transitions for the AES analyzed. The results of the present study indicate a reasonable agreement with the results for Cd metal.