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On the Measurement of Solid State Compton Profiles by Inelastic Fast‐Ion‐Atom Collisions under Channeling Conditions. A Case Study
Author(s) -
Bell F.
Publication year - 1985
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2221270220
Subject(s) - compton scattering , atomic physics , ion , inelastic scattering , electron , atom (system on chip) , physics , nuclear physics , scattering , optics , quantum mechanics , computer science , embedded system
Solid state Compton profiles can be obtained by inelastic ion‐atom scattering. The energy distribution of ejected electrons within the region of the binary encounter peak is connected with the Compton profile of the target atom. The question is discussed whether the core contribution to the total Compton profile can be suppressed under channeling conditions.