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The Spin Density and Optical Properties of Amorphous Thin Arsenic Silicate Films
Author(s) -
AlAni S. K. J.,
Hogarth C. A.
Publication year - 1984
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2221260135
Subject(s) - amorphous solid , dangling bond , refractive index , materials science , absorption edge , annealing (glass) , thin film , absorption spectroscopy , absorption (acoustics) , silicate , dispersion (optics) , analytical chemistry (journal) , condensed matter physics , optics , chemistry , silicon , crystallography , nanotechnology , optoelectronics , composite material , band gap , chromatography , physics , organic chemistry
The spin density of amorphous As 2 O 5 /SiO thin films is found to be lower than that of SiO films deposited under similar conditions. The measurements show a decrease in the spin density of an amorphous As 2 O 5 /SiO film with increasing temperature which can be explained in terms of some annealing of dangling bonds. The fundamental absorption edge of these films at different temperatures is investigated and analysed assuming optical absorption by indirect transitions. The infrared absorption spectra indicate some chemical bonding between the two oxides. Experimental data on the wavelength dependence of the refractive index are presented. The dispersion of the refractive index follows a single‐oscillator model. Some effects of room temperature aging of the films are also presented.