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Extended X‐Ray Absorption Fine Structure in RAl 2 Ga 2 Intermetallies
Author(s) -
Hatwar T. K.,
Padalia B. D.,
Ghatikar M. N.,
Chopra D. R.
Publication year - 1984
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2221260133
Subject(s) - extended x ray absorption fine structure , absorption (acoustics) , intermetallic , surface extended x ray absorption fine structure , x ray absorption fine structure , absorption edge , materials science , scattering , crystal structure , crystallography , chemistry , absorption spectroscopy , physics , optics , spectroscopy , band gap , optoelectronics , alloy , quantum mechanics , composite material
Abstract The near‐edge structure (NES) and the extended X‐ray absorption fine structure (EXAFS) associated with the K‐absorption edge of Ga and L 3 ‐edges of the rare earths (R) (where R La, Ce, Pr, Nd, Eu, and Yb) are studied in RAl 2 Ga 2 intermetallics using a 600 mm curved crystal spectrograph. The results obtained are discussed in the light of the recent point scattering theory of EXAFS proposed by Lytle, Sayers, and Stern. The EXAFS data are used to obtain the nearneighbour distances in these newly synthesized compounds.