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Angular‐Resolved X‐Ray Photoelectron Spectra of Valence and Core Levels from GaS
Author(s) -
Chassé T.,
Berg U.,
Brümmer O.
Publication year - 1984
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2221250132
Subject(s) - spectral line , valence (chemistry) , photoelectric effect , x ray photoelectron spectroscopy , atomic physics , x ray , scattering , chemistry , analytical chemistry (journal) , physics , nuclear magnetic resonance , optics , chromatography , astronomy , organic chemistry
Angular‐resolved X‐ray photoelectron spectra (ARXPS) are measured for valence bands and Ga core levels from the layer compound GaS. The spectra are interpreted taking into account initial and final state effects. Structures of dominating p z ‐ and p x , y ‐like character are identified in the valence region. The core‐level spectra are qualitatively understood on the basis of scattering of photoelectrons within the solid.