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Calculation of the Intensity of the Small‐Angle X‐Ray Scattering by Small Clusters of Intrinsic Point Defects
Author(s) -
Kienle W.,
Frank W.
Publication year - 1984
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2221240108
Subject(s) - scattering , small angle scattering , lattice (music) , small angle x ray scattering , intensity (physics) , vacancy defect , agglomerate , crystallographic defect , condensed matter physics , physics , molecular physics , computational physics , materials science , optics , acoustics , composite material
The small‐angle X‐ray intensity scattered by small platelet‐shaped agglomerates of vacancy or self‐interstitial type is calculated in two ways: within the framework of continuum theory or by a discrete‐lattice model. Both the methods take into account that small clusters are not fully relaxed. A comparison of the numerical results of the two methods is presented for copper. It is found that both the methods lead to results which considerably deviate from those obtained for completely relaxed clusters.