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Scattering by Ions near Interfaces
Author(s) -
Gerlach E.
Publication year - 1984
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2221210235
Subject(s) - scattering , ion , electrical resistivity and conductivity , materials science , thin film , space (punctuation) , optics , energy (signal processing) , physics , nanotechnology , electrical engineering , computer science , engineering , quantum mechanics , operating system
Using the “energy loss method” the resistivity is calculated due to scattering by an ion being inside or outside a conducting film (placed between two insulating materials). As examples a half‐space and a thin film are studied.
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