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A Method for the Evaluation of Dielectric Relaxation Parameters in Electronic Excited State
Author(s) -
Prakash J.
Publication year - 1983
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2221180128
Subject(s) - dielectric , excited state , relaxation (psychology) , activation energy , dipole , cole–cole equation , impurity , polarization (electrochemistry) , materials science , ground state , atomic physics , chemistry , condensed matter physics , physics , optoelectronics , psychology , social psychology , organic chemistry
A method is suggested to evaluate the dielectric relaxation parameters of impurity‐vacancy dipoles in the electronic excited state (ees). The value of the maximum increase observed during the photo‐induced polarization measurements helps in evaluating the dielectric relaxation parameters in ees. Relevant expressions are developed and discussed. The activation energy and fundamental relaxation time in ees in KI:S − − are found to be smaller than their corresponding values in the electronic ground state (egs), whereas the activation energy in ees in KI:Se − − is found to be greater than that observed in egs. In both these cases the product of activation energy and fundamental relaxation time in ees is found to be less than its corresponding value in egs.