Point Defect Aggregates in  γ ‐Irradiated LiF Single Crystals | Zendy

Frugoli P. A. | Zendy; Pimentel C. A. | Zendy

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Point Defect Aggregates in γ ‐Irradiated LiF Single Crystals

Author(s) -

Frugoli P. A.,

Pimentel C. A.

Publication year - 1983

Publication title -

physica status solidi (b)

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.51

H-Index - 109

eISSN - 1521-3951

pISSN - 0370-1972

DOI - 10.1002/pssb.2221170215

Subject(s) - coalescence (physics) , diffractometer , irradiation , materials science , bragg peak , crystallographic defect , bragg's law , scattering , single crystal , crystal (programming language) , reflection (computer programming) , angstrom , molecular physics , crystallography , optics , crystal structure , chemistry , diffraction , physics , nuclear physics , programming language , astrobiology , computer science

Diffuse X‐ray scattering near the Bragg reflection and Bragg line profile analyses are made in γ‐irradiated LiF single crystals using a double crystal X‐ray diffractometer. A preferential alteration in the profile parameters is noted. Clusters with mean parameter sizes from hundreds to thousands of angstroms are observed but each sample presents a set of average size values. The nature of the clusters is found to depend on the γ‐dose: vacancies at low dose (≈ 10 Mrd) and interstitials at high dose (≈ 50 Mrd). Some process of coalescence at 50 Mrd seems to occur.

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