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Point Defect Aggregates in γ ‐Irradiated LiF Single Crystals
Author(s) -
Frugoli P. A.,
Pimentel C. A.
Publication year - 1983
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2221170215
Subject(s) - coalescence (physics) , diffractometer , irradiation , materials science , bragg peak , crystallographic defect , bragg's law , scattering , single crystal , crystal (programming language) , reflection (computer programming) , angstrom , molecular physics , crystallography , optics , crystal structure , chemistry , diffraction , physics , nuclear physics , programming language , astrobiology , computer science
Abstract Diffuse X‐ray scattering near the Bragg reflection and Bragg line profile analyses are made in γ‐irradiated LiF single crystals using a double crystal X‐ray diffractometer. A preferential alteration in the profile parameters is noted. Clusters with mean parameter sizes from hundreds to thousands of angstroms are observed but each sample presents a set of average size values. The nature of the clusters is found to depend on the γ‐dose: vacancies at low dose (≈ 10 Mrd) and interstitials at high dose (≈ 50 Mrd). Some process of coalescence at 50 Mrd seems to occur.