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Point Defect Aggregates in γ ‐Irradiated LiF Single Crystals
Physica Status Solidi (b)Peer ReviewedFrugoli P. A. +11983Journals
Diffuse X‐ray scattering near the Bragg reflection and Bragg line profile analyses are made in γ‐irradiated LiF single crystals using a double crystal X‐ray diffractometer. A preferential alteration in the profile parameters is noted. Clusters with mean parameter sizes from hundreds to thousands of angstroms are observed but each sample presents a set of average size values. The nature of the clusters is found to depend on the γ‐dose: vacancies at low dose (≈ 10 Mrd) and interstitials at high dose (≈ 50 Mrd). Some process of coalescence at 50 Mrd seems to occur.
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