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Positron–annihilation measurements of the Fermi surface of copper‐base solid solutions with gallium, germanium, and nickel
Author(s) -
Steinmetz K.H.,
Fischer H.P.,
Martin M.,
Nembach E.
Publication year - 1983
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2221160219
Subject(s) - solid solution , germanium , gallium , fermi level , fermi surface , nickel , annihilation , materials science , copper , radius , positron , positron annihilation , electron , atom (system on chip) , atomic physics , analytical chemistry (journal) , molecular physics , chemistry , physics , silicon , metallurgy , nuclear physics , computer security , chromatography , computer science , embedded system
The {011} cross‐section of the Fermi surface of Cu‐rich solid solutions with Ga, Ge, and Ni is measured by positron annihilation. The “rotating specimen” method is used. The concentrations of Ga and Ge cover the whole range of primary solid solutions; c Ni extends up to 22 at%. For all three solutes investigated, the neck radius of the Fermi surface increases monotonously with solute concentration. For a given electron per atom ratio e / a , Ga widens the neck 32% more than Ge does. All three solutes decrease the ratio of maximum to minimum diameter of the Fermi surface. The electronic structure of these solid solutions is not exclusively determined by the e / a ratio, but depends on the specific properties of the solute. The present experimental results do not support the view that the extent of primary solid solutions is mainly governed by the electron structure.