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Thermally‐stimulated excitation of electrons from deep traps of insulators in electric fields
Author(s) -
Köster H.,
Iassievich I. N.,
Hübner K.
Publication year - 1983
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2221150210
Subject(s) - electron , excitation , electric field , atomic physics , insulator (electricity) , thermal , lattice vibration , condensed matter physics , lattice (music) , physics , materials science , phonon , optoelectronics , quantum mechanics , thermodynamics , acoustics
An analytic expression for the probability of thermal activation of electrons trapped in deep defect states of an insulator is derived taking explicitly into account an electric field and lattice vibrations. From the activation probability a detrapping current intensity is calculated, which is in good agreement with corresponding experimental results obtained, for example, by means of the thermally stimulated electron emission (TSEE). In this way, for the TSEE effect a possible microscopic explanation is found for the first time.