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The quantum yield spectra of electron emission of solids in XUV region
Author(s) -
Elango M.,
Kikas A.,
Nǒmmiste E.,
Pruulmann J.,
Saar A.
Publication year - 1982
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2221140223
Subject(s) - electron , atomic physics , spectral line , extreme ultraviolet , secondary emission , photon , yield (engineering) , secondary electrons , physics , quantum yield , optics , laser , quantum mechanics , fluorescence , thermodynamics
An analysis of the physical information containing in the quantum yield spectra of photoelectron emission of solids in the XUV region is presented. It is shown that these spectra may be obtained at least in three meaningful counting regimes: current, pulse, and n‐electron regimes. A proper treatment of the spectra gives quantitative information about secondary electron escape length, escape probability for an electron at surface, and the number of secondary electrons created by one XUV photon. The experiments with alkali chlorides in the 100 to 250 eV photon energy region give the values of 300 to 800 Å for the escape length and 11 to 17 eV for the energy need to create one low‐energy electron.