Premium
Secondary Electron Radiation from Different Targets Exposed to Photons with Energy 0.1 to 3 MeV
Author(s) -
Akkerman A. F.,
Botvin V. A.,
Grudskii M. Ya.,
Smirnov V. V.,
Chernov G. Ya.,
Shilenkova M. V.
Publication year - 1982
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2221100133
Subject(s) - photon , electron , monte carlo method , physics , radiation , nuclear physics , secondary electrons , differential (mechanical device) , atomic physics , computational physics , optics , mathematics , statistics , thermodynamics
Differential and integral yields of secondary electrons from different targets bombarded by monoenergetic photon beams are calculated using the Monte Carlo method. The results are compared to experimental data and values calculated by other authors. The discovered 20 to 30% decrease of calculated backward yields according to experimental data for heavy elements is explained by the limited applicability of Sauter's formula for the description of photoelectron angular distribution.