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Investigation of the XPS Valence Band Structure from Sn Chalcogenides
Author(s) -
Berg U.,
Chassé T.,
Brümmer O.
Publication year - 1981
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2221080227
Subject(s) - valence (chemistry) , valence band , x ray photoelectron spectroscopy , spectral line , semimetal , atomic orbital , atomic physics , electronic structure , valence electron , quasi fermi level , chemistry , electron , molecular physics , materials science , condensed matter physics , band gap , physics , nuclear magnetic resonance , computational chemistry , organic chemistry , quantum mechanics , astronomy
XPS valence band spectra reflect the electronic density of states weighted with cross‐sections. The spectra will give additional information about the symmetry of the electron wave function, if they are measured in dependence on the electron emission angles. Valence band spectra of SnS, SnSe, SnTe, and SnS 2 are measured partly in dependence on the polar angle θ. These measurements allow an identification of the symmetry of valence orbitals from intensity variations of the valence band maxima.