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Line Broadening and Line Displacement of EPR Transitions Produced by Inhomogeneous Plane Stresses in a Two‐Layer System
Author(s) -
Gehlhoff W.,
Segsa K. H.
Publication year - 1981
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2221060120
Subject(s) - line (geometry) , layer (electronics) , materials science , electron paramagnetic resonance , displacement (psychology) , condensed matter physics , symmetry (geometry) , plane (geometry) , substrate (aquarium) , strain (injury) , composite material , optics , physics , nuclear magnetic resonance , geometry , mathematics , medicine , psychology , oceanography , psychotherapist , geology
The strain induced changes of lineshapes and line positions of EPR transitions in a film‐substrate system with elastic cubic symmetry are analysed. Thereby it is assumed, that the distributions of stresses and strains in the two‐layer system are induced by inhomogeneous plane stresses developed in the film.