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Effects of Microstructure Scale on the Temperature Coefficient of Electrical Resistivity
Author(s) -
Aubauer H. P.,
Rossiter P. L.
Publication year - 1981
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2221040236
Subject(s) - electrical resistivity and conductivity , microstructure , temperature coefficient , mean free path , materials science , thermodynamics , thermal conduction , condensed matter physics , scale (ratio) , component (thermodynamics) , electron , statistical physics , physics , composite material , quantum mechanics
The temperature coefficient of resistivity dϱ/d T is shown to contain a component which depends upon the microstructure scale R 0 and the conduction electron mean free path Λ. The size of this contribution depends upon the rate of change of Λ with temperature but in general dϱ/d T will be larger when R 0 < Λ. The general predictions of the theory are shown to be in agreement with the limited experimental data available.