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Absolute Cross‐Section for Raman Scattering by Phonons in Silicon
Author(s) -
Grimsditch M.,
Cardona M.
Publication year - 1980
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2221020112
Subject(s) - raman scattering , cross section (physics) , silicon , raman spectroscopy , phonon , materials science , x ray raman scattering , scattering , optics , section (typography) , atomic physics , computational physics , physics , optoelectronics , condensed matter physics , computer science , quantum mechanics , operating system
Abstract The absolute cross‐sections for Raman scattering in silicon measured at various frequencies in the visible spectrum by two different experimental techniques are reanalysed in the light of recent developments. Agreement between the results obtained by both the methods clears the discrepancies previously observed at high frequencies. Experimental results are compared with theoretical calculations.