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Resonant Secondary Emission Spectroscopy
Author(s) -
Kanehisa A.,
Balkanski M.
Publication year - 1980
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2221020104
Subject(s) - spectroscopy , polarization (electrochemistry) , photon , atomic physics , physics , luminescence , wave vector , scattering , raman spectroscopy , optics , chemistry , quantum mechanics
Abstract A prospective view is taken of a new field of optical spectroscopy, unifying resonance Raman scattering and luminescence, with main emphasis on conceptual and theoretical aspects. The method consists in explicitly exploiting two independent sets of probes, ( e , ω, k ) and (e′, ω′, k′), i. e. polarization, frequency, and wave vector of incident and scattered photons, respectively. As compared with absorption spectroscopy, where one has only one set of probes ( e , ω, k ), the secondary emission spectroscopy gives higher information about the dynamics of the material: interaction in the intermediate states or relaxation , characterized experimentally and theoretically by the secondary emission intensity I s ( e , ω, k; e′, ω′, k′), which is a measure of polarization‐, energy‐, and momentum‐ correlation of incident and scattered photons.