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Excition reflection spectra under high‐intensity excitation in CdS and CdSe
Author(s) -
Kuroiwa A.,
Saito H.,
Shionoya S.
Publication year - 1979
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2220960153
Subject(s) - reflection (computer programming) , excitation , spectral line , exciton , atomic physics , intensity (physics) , relaxation (psychology) , luminescence , nitrogen laser , materials science , molecular physics , chemistry , optics , physics , condensed matter physics , psychology , social psychology , quantum mechanics , astronomy , computer science , programming language
Exciton reflection spectra under high‐intensity excitation by a nitrogen laser are studied in CdS and CdSe at 4.2 K. With increasing excitation density, the reflection peak intensity decreases, simultaneously the spectral width becoming broader, and finally the reflection structure becomes very obscure. Shapes of observed spectra are analyzed in terms of the classical oscillator model using a phenomenological damping term. From the comparison of the results of the analysis with luminescence spectra simultaneously measured, it is concluded that the obscurity of the reflection structure is caused by the shortening of the transverse relaxation time of excitons due to the inelastic collision of excitons.