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Influence of Dislocations on the Cyclotron Resonance Absorption in Tellurium
Author(s) -
Gerstenhauer E.,
Bauer G.,
Grosse P.,
Doukhan J. C.
Publication year - 1979
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2220930221
Subject(s) - tellurium , dislocation , materials science , dielectric , condensed matter physics , resonance (particle physics) , cyclotron resonance , absorption (acoustics) , wavelength , basal plane , optics , cyclotron , atomic physics , chemistry , physics , composite material , ion , optoelectronics , metallurgy , organic chemistry
In tellurium a ‐glide dislocation systems are activated by uniaxial compression experiments at T = 300 and 77 K. The dislocation substructures, chosen with respect to their elastic strain field, are characterized by etch pit counting and X‐ray topography. Optical transmission experiments performed under cyclotron resonance conditions in the submillimeter wavelength region (Λ = 337 and 311 μm) show a considerable effect of the dislocation density and configuration on the observed spectra. The appearance of CRI mode absorption is accounted by a change of the dielectric tensor in the basal plane, as caused by the dislocation strain field.