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X‐Ray Thermal Diffuse Scattering Measurements of the [100] and [111] Phonon Dispersion Curves of Indium Arsenide
Author(s) -
Orlova N. S.
Publication year - 1979
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2220930206
Subject(s) - phonon , scattering , indium arsenide , dispersion (optics) , indium , gallium arsenide , materials science , intensity (physics) , phonon scattering , condensed matter physics , thermal , optics , molecular physics , physics , optoelectronics , meteorology
Measurements of the thermal diffuse X‐ray scattering are performed from the (100) and (111) planes in indium arsenide single crystals. The intensities of the second‐ and third‐order scattering are calculated using the two‐atom chain model with different masses and four interaction parameters. The first‐order thermal diffuse scattering intensity is analysed and yields the acoustic and optic phonon dispersion curves in the [100] and [111] symmetry directions.