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Theory of Broadening in X‐Ray Diffraction Peaks Caused by Substitutional Disorder
Author(s) -
Arias A. González
Publication year - 1979
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2220930136
Subject(s) - equivalence (formal languages) , diffraction , variance (accounting) , order (exchange) , mathematics , selection (genetic algorithm) , physics , pure mathematics , optics , computer science , accounting , finance , artificial intelligence , economics , business
In a preceding paper the diffraction theory on this subject has been worked out by using far less approximations than those which had been involved in earlier tratments, arriving at more general and exact results. The approach used to obtain the expressions for the variance and integral breadth of reflections differs from another one which sometimes had been used in the literature. It is shown fthe equivalence of both approaches by genralizing that of Wilson. The connetion betwen diferent probilistic concepts and order parameters used in those treatments is elucidated as well. It is also shown the equivalence with some diffraction theories on layer structures with mistakes. The expression for the variance, as well as their relation with the integral breadths, are obtained in detail in order to facilite the selection between two probable domain size distributions in crystals.