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Impurity scattering effect on the cyclotron resonance of carriers in Cu 2 O
Author(s) -
Goltzené A.,
Schwab C.
Publication year - 1979
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2220920217
Subject(s) - polaron , cyclotron resonance , impurity , effective mass (spring–mass system) , excitation , doping , valence (chemistry) , scattering , cyclotron , atomic physics , resonance (particle physics) , wavelength , valence band , ion cyclotron resonance , excitation wavelength , materials science , chemistry , condensed matter physics , physics , band gap , ion , nuclear physics , optics , electron , optoelectronics , organic chemistry , quantum mechanics
Cyclotron resonance is made on purest and deliberately Fe‐doped Cu 2 O to assess the extrinsic origin of one of the two polaron masses previously reported (0.58 m 0 and 0.69 m 0 ). Only one mass is observed, which shifts to higher values with doping and is excitation wavelength dependent, except for the best undoped material. The latter shows the lowest mass, ascribed therefore to the uppermost valence band. Material improvements are discussed with respect to the carrier lifetimes.