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Scattering of X‐rays near the K absorption edge I. Fluorescence and resonant Raman scattering in transition metals
Author(s) -
Suortti P.
Publication year - 1979
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2220910232
Subject(s) - fluorescence , scattering , absorption edge , absorption (acoustics) , raman scattering , analytical chemistry (journal) , radiative transfer , atomic physics , yield (engineering) , absorption cross section , oscillator strength , raman spectroscopy , materials science , radiation , chemistry , cross section (physics) , physics , optics , spectral line , band gap , optoelectronics , chromatography , quantum mechanics , astronomy , metallurgy
Formulas for the resonant cross section of X‐rays are rederived emphasizing the similarity of the resonant Raman scattering (RRS) to the fluorescence, and are given in terms of the oscillator strengths and radiative widths. In both processes only a fraction results in radiation, and for the RRS this is termed the RRS yield, w RRS , in analogy with the fluorescence yield, w K . Measurements are made in the symmetrical reflection geometry from totally absorbing samples. The fluorescence yield is measured CuKα as exciting radiation for Ti, V, Cr, Mn, and Fe, the results being 0.237, 0.265, 0.291, 0.325, 0.356, respectively. The absolute cross section of the (1s, 2p) contribution to the RRS is measured for Cr, Mn, Fe, Ni, and Cu at energies 42 to 940 eV below the K absorption edge. The RRS yields are 0.404, 0.426, 0.422, 0.415 (0.460 in another measurement), and 0.473 (0.468), respectively. Also evidence is found for the existence of the (1s, 3p) contribution to the RRS.