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The Dynamic Dielectric Function in HgSe and HgTe
Author(s) -
Szuszkiewicz W.,
Witowski A. M.,
Grynberg M.
Publication year - 1978
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2220870229
Subject(s) - refractive index , dielectric function , dielectric , interference (communication) , function (biology) , condensed matter physics , wavelength , chemistry , absorption (acoustics) , infrared , optics , materials science , physics , optoelectronics , telecommunications , channel (broadcasting) , evolutionary biology , computer science , biology
Absorption measurements in the infrared region from 5 to 30 μm for HgTe at 295 K and for HgSe at 10, 80, and 295 K are performed. On the basis of the observed interference phenomena the dependence of the refractive index on the wavelength is obtained. These results are analysed in terms of the dynamic dielectric function. The contribution of the Γ 8 v→ Γ 8 ctransitions is calculated in terms of Kane's band structure model. From the comparison of theoretical results and experimental data the value of ϵ′∞, treated as a fitting parameter, is determined. The relation ϵ′∞( T ) determined for HgSe is somewhat different from that found for HgTe and differs from the value proposed earlier for HgSe.