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Optical properties of amorphous and polycrystalline BeO thin films from electron energy loss measurements
Author(s) -
Gründler R.,
Breuer K.,
Tews W.
Publication year - 1978
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2220860138
Subject(s) - crystallite , amorphous solid , materials science , electron , kramers–kronig relations , thin film , energy (signal processing) , dielectric , dielectric function , analytical chemistry (journal) , atomic physics , optics , condensed matter physics , optoelectronics , physics , chemistry , crystallography , refractive index , nanotechnology , chromatography , quantum mechanics , metallurgy
Energy loss measurements on amorphous and polycrystalline BeO thin films are performed applying 25 keV electrons. From the energy‐dependent loss function Im (−1/ε) the dielectric function and its first energy derivative, the reflectance, η eff , ε 2 E 2 up to 44 eV are computed using the Kramers‐Kronig‐analysis and well‐known formulae. The results obtained on polycrystalline BeO are discussed with respect to band structure information. The corresponding spectra of amorphous BeO are compared with those of the polycrystalline material.