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Theory of the X‐ray and optical properties of polysulphur nitride
Author(s) -
Friesen W. I.,
Litvin D. B.,
Bergersen B.
Publication year - 1978
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2220850236
Subject(s) - dielectric function , x ray , nitride , dielectric , electronic band structure , physics , function (biology) , condensed matter physics , materials science , atomic physics , chemistry , mathematical physics , quantum mechanics , nanotechnology , layer (electronics) , evolutionary biology , biology
The extended Hückel method is used to calculate various band structure dependent properties of polysulphur nitride (SN) x . X‐ray emission spectra are computed and are presented as a means of differentiating between conflicting reported band structures. The interband contribution to the imaginary part of the dielectric function is also calculated and is discussed in relation to experimental results quoted in the literature.