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Optical Properties of Cu and Ag in the Intermediate Region between Pure Drude and Interband Absorption
Author(s) -
Hollstein T.,
Kreibig U.,
Leis F.
Publication year - 1977
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2220820217
Subject(s) - electron , dielectric , absorption edge , condensed matter physics , electron scattering , relaxation (psychology) , scattering , materials science , drude model , absorption (acoustics) , lattice constant , thermal conduction , lattice (music) , chemistry , atomic physics , optics , physics , band gap , composite material , psychology , social psychology , optoelectronics , quantum mechanics , diffraction , acoustics
The complex dielectric constant ϵ of thick Cu and Ag films on fused quartz substrates is determined at 300 and 1.5 K by a modified v. Fragstein‐Kampermann method in the spectral region between 0.41 and 0.71 m̈n. The relaxation frequency of the conduction electrons is determined and the contributions of electron‐phonon, electron‐surface, electron‐lattice, and electron‐electron scattering are separated. No further absorption mechanisms have to he taken into consideration to explain the experimental results. By decomposing ϵ into interband and conduction electron contributions, the temperature dependence of the interband transition edge of Cu is evaluated. The edge is shifted from 2.18 eV (1.5 K) to 2.15 eV (300 K). There are indications of indirect transitions, but a quantitative determination is not possible.