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Optical properties and plasmon dispersion in epitaxial (SN) x by electron energy loss spectroscopy
Author(s) -
Stolz H. J.,
Petri E.,
Otto A.
Publication year - 1977
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2220800133
Subject(s) - wave vector , plasmon , electron , electron energy loss spectroscopy , dispersion (optics) , spectroscopy , condensed matter physics , materials science , molecular physics , atomic physics , chemistry , optics , physics , quantum mechanics
Wavevector dependent electron energy loss spectra of epitaxial films of (SN) x between 0 to 30 eV up to wave vector transfers of 1 Å +1 are measured for k parallel and perpendicular to the chain axis. The optical constants ϵ 1 , ϵ 2 and the reflectivity R are derived by a Kramers‐Kronig analysis for zero wavevector. Peak positions in R agree with optical measurements. A change in the dispersion of the bulk plasmon of the conduction electrons is attributed to the interference with free‐electron‐like single particle excitations.