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Electro‐optic properties of CuCl below the absorption edge
Author(s) -
Mohler E.,
Thomas B.
Publication year - 1977
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2220790214
Subject(s) - dielectric , birefringence , absorption edge , polarizability , attenuation coefficient , materials science , electric field , optics , wavelength , dispersion (optics) , absorption (acoustics) , condensed matter physics , optoelectronics , chemistry , band gap , physics , organic chemistry , quantum mechanics , molecule
The dispersion and temperature dependence of the electro‐optic coefficient r 41 Tof CuCl‐ are measured for wavelengths between 700 nm and the absorption edge near 400 nm. A method is described to eliminate the influence of residual strain birefringence which otherwise leads to serious errors. The dispersion of the optical dielectric constant and the electro‐optic coefficient is used to determine a schematic spectrum of the imaginary part of the dielectric constant and its changes in an external electric field. A model for the lattice contribution to the electro‐optic effect of CuCl based on the concept of bond polarizability is discussed.