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Thickness Dependence of Localized States in a Thin Film with Internal Layer Defect
Author(s) -
Duda A.,
Maciejewski W.
Publication year - 1976
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2220740125
Subject(s) - spins , condensed matter physics , layer (electronics) , materials science , thin film , surface layer , spin (aerodynamics) , composite material , physics , nanotechnology , thermodynamics
The thickness effect in the spin‐wave spectrum of a thin film withone internal layer defect is studied. The behaviour of the localized modes and their generation conditions under variation of the film thickness are described by strictly derived analytic formulac. The shape of the thickness effect is related to the pinning situations of the surface spins.