Premium
Thin film with anisotropically coupled internal layer defect. Localized states
Author(s) -
Maciejewski W.,
Duda A.
Publication year - 1975
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2220720222
Subject(s) - antisymmetric relation , layer (electronics) , coupling (piping) , materials science , thin film , condensed matter physics , thin layer , molecular physics , optics , physics , composite material , nanotechnology , mathematical physics
The model of a thin film with an internal anisotropically coupled layer defect is consider ed. Symmetric and antisymmetric defect coupling is assumed. An analytical method is proposed for the study of localized states. The conditions for the existence of acoustic and optical localized states are determined.