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Deformation of a Ni 〈111〉 film on Cu substrate
Author(s) -
Dragila R.
Publication year - 1975
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2220690235
Subject(s) - materials science , deformation (meteorology) , thin film , lattice constant , condensed matter physics , lattice (music) , phonon , composite material , crystallography , optics , physics , chemistry , diffraction , nanotechnology , acoustics
The discrete lattice theory has been used to determine the deformation near the free surface of Ni 〈111〉 thin film. The force constants have been chosen to fit the elastic constants and phonon dispersion data. Also the deformation of Ni 〈111〉 film near the contact with bulk Cu base is calculated in the frames of both discrete and continuum theories.