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Multiple scattering and central limit theorem: A monte carlo approach
Author(s) -
Desalvo A.,
Rosa R.
Publication year - 1975
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2220690108
Subject(s) - monte carlo method , central limit theorem , coulomb , scattering , radius , limit (mathematics) , statistical physics , physics , range (aeronautics) , distribution (mathematics) , computational physics , mathematics , quantum mechanics , mathematical analysis , materials science , statistics , computer science , computer security , composite material , electron
The angular distribution of 1 MeV protons across layers of amorphous SiO 2 of various reduced thickness τ (from 0.2 to 20) is evaluated by Monte Carlo simulation for different interaction potentials. A simple γ −2 potential and a Coulomb potential truncated at the Thomas‐Fermi screening radius turn out to be good approximations at low and high τ values, respectively, while Meyer's detailed calculations are satisfactory on the whole thickness range. The final distribution depends critically on the chosen potential: an γ −1 dependence at small impact parameters is necessary in order to satisfy the central limit theorem at large thicknesses.