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Double reflection dips from grating ruled semiconductors
Author(s) -
Teng L. F.,
Alexander R. W.,
Bell R. J.,
Fischer B.
Publication year - 1975
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2220680207
Subject(s) - grating , reflection (computer programming) , reflectivity , semiconductor , plasmon , optics , spectral line , physics , condensed matter physics , materials science , optoelectronics , quantum mechanics , computer science , programming language
The double reflectivity dips, previously observed by Fischer et al. and Anderson et al., which appeared in the reflection spectra of grating surfaces on, the Te‐doped semiconductors GaAs and InSb around both the plasmon and phonon frequencies have been measured in more detail. In the plasmon region, several possible explanations of the phenomenon are discussed, but the favored explanation involves surface damage. A simple two‐region reflectivity equation checked with a rigorous grating theory is proposed and is shown to fit the data well.