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Diffuse X‐Ray Determination of the Energy of Mixing and Elastic Constants of GeSi Solid Solutions
Author(s) -
Bublik V. T.,
Gorelik S. S.,
Zaitsev A. A.,
Polyakov A. Y.
Publication year - 1974
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2220660203
Subject(s) - solid solution , lattice constant , mixing (physics) , scattering , lattice (music) , lattice energy , fourier transform , materials science , analytical chemistry (journal) , thermodynamics , chemistry , crystallography , physics , diffraction , crystal structure , optics , quantum mechanics , chromatography , acoustics , metallurgy
The short‐range order and elastic properties of GeSi solid solutions of 28, 54, and 64% Si are studied by means of X‐ray diffuse scattering measurements. The mixing energy of the system taking into account the existence of two f.c.c. sublattices in the diamond structure is determined by extrapolating the long‐wave Fourier transforms of the concentration fluctuations C q to q = 0 points corresponding to the node (400) and equals for q = 0 to W ( q =o) = (2.5 ± 0.2) kcal/mol. The elastic constants of the GeSi solid solutions are determined and their positive deviations obtained from the additive values which are in good agreement with the data of the lattice parameter of the system.