Comments on the evidence for sharp and gradual optical absorption edges in amorphous germanium | Zendy

Connell G. A. N. | Zendy; Lewis A. | Zendy

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Comments on the evidence for sharp and gradual optical absorption edges in amorphous germanium

Author(s) -

Connell G. A. N.,

Lewis A.

Publication year - 1973

Publication title -

physica status solidi (b)

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.51

H-Index - 109

eISSN - 1521-3951

pISSN - 0370-1972

DOI - 10.1002/pssb.2220600132

Subject(s) - germanium , amorphous solid , enhanced data rates for gsm evolution , absorption (acoustics) , evaporation , materials science , absorption edge , amorphous semiconductors , optics , optoelectronics , crystallography , chemistry , physics , computer science , telecommunications , composite material , thermodynamics , silicon , band gap

Several investigators have analyzed optical data on amorphous Ge films prepared by evaporation on room‐temperature substrates to derive a sharp absorption edge near 0.5 eV. A re‐examination of their work shows that the sharp edges, found hitherto, may be artifacts resulting from either experimental or calculational errors and that the preponderance of the current evidence favors a gradual absorption edge.

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