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Comments on the evidence for sharp and gradual optical absorption edges in amorphous germanium
Author(s) -
Connell G. A. N.,
Lewis A.
Publication year - 1973
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2220600132
Subject(s) - germanium , amorphous solid , enhanced data rates for gsm evolution , absorption (acoustics) , evaporation , materials science , absorption edge , amorphous semiconductors , optics , optoelectronics , crystallography , chemistry , physics , computer science , telecommunications , composite material , thermodynamics , silicon , band gap
Several investigators have analyzed optical data on amorphous Ge films prepared by evaporation on room‐temperature substrates to derive a sharp absorption edge near 0.5 eV. A re‐examination of their work shows that the sharp edges, found hitherto, may be artifacts resulting from either experimental or calculational errors and that the preponderance of the current evidence favors a gradual absorption edge.