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Photoelectric Properties of Mg 2 Si, Mg 2 Ge, and Mg 2 Sn I. X‐Ray Excitation
Author(s) -
Tejeda J.,
Cardona M.,
Shevchik N. J.,
Langer D. W.,
Schönherr E.
Publication year - 1973
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2220580118
Subject(s) - photoelectric effect , atomic physics , excited state , x ray photoelectron spectroscopy , valence (chemistry) , excitation , core electron , auger , analytical chemistry (journal) , valence electron , auger effect , spectral line , plasmon , auger electron spectroscopy , x ray , materials science , chemistry , electron , physics , nuclear magnetic resonance , optics , optoelectronics , organic chemistry , quantum mechanics , chromatography , nuclear physics , astronomy
The energy distribution spectra of photoelectrons (XPS) and Auger electrons (AES) excited with AlK α radiation in Mg 2 Si, Mg 2 Ge, and Mg 2 Sn are reported. For the purpose of determining core shifts, measurements were also performed on the elemental constituents. These measurements yield information about the density of valence states, the position and the chemical shifts of the core levels. The energy of the valence plasmons is also obtained. This paper (I) is followed by a second one (II) in which similar results obtained with far UV excitation are reported and discussed in the context of the present work.