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Diffuse X‐Ray Scattering from the Displacement Field of Point Defects in KBr Single Crystals
Author(s) -
Spalt H.,
Lohstöter H.,
Peisl H.
Publication year - 1973
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2220560208
Subject(s) - ion , vacancy defect , tetragonal crystal system , scattering , displacement (psychology) , reciprocal lattice , crystallographic defect , field (mathematics) , symmetry (geometry) , displacement field , chemistry , atomic physics , molecular physics , materials science , crystallography , crystal structure , physics , optics , diffraction , geometry , psychology , mathematics , organic chemistry , finite element method , pure mathematics , psychotherapist , thermodynamics
Diffuse X‐ray scattering from the displacement field of point defects in low temperature X‐irradiated KBr single crystals was measured. The distribution of diffuse scattered intensity in reciprocal space confirms the theoretical predictions of scattering from isolated point, defects. From absolute scattered intensities the double force tensors describing the long range displacement field of an interstitial anion and anion vacancy are derived. The volume changes per interstitial anion and anion vacancy are determined to be (2.5 0.2) atomic volumes and (0.7 ± 0.2) atomic volumes, respectively. The displacement field of the interstitial ion has tetragonal symmetry. Models for the interstitial ion configuration which are in accordance with this symmetry are proposed.