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Investigation of Electron Penetration and X‐Ray Production in Solid Targets
Author(s) -
Matsukawa T.,
Murata K.,
Shimizu R.
Publication year - 1973
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.2220550139
Subject(s) - electron microprobe , electron , penetration (warfare) , x ray , scanning electron microscope , monte carlo method , scattering , electron microscope , materials science , ionization , penetration depth , electron scattering , atomic physics , physics , optics , ion , nuclear physics , composite material , metallurgy , mathematics , statistics , operations research , quantum mechanics
The Monte Carlo method based on a single scattering model is applied to investigate the behaviour of electrons in pure and mixed specimens using the Electron Probe Microanalyser (Epma) and the Scanning Electron Microscope (SEM). Fairly good agreement is obtained with experiments on electron backscattering, penetration, and X‐ray production. The effect of the mean ionization potential on the final results is also discussed.